AIO 3200 is a wafer test system to test in the memory devices on wafer. This system uses a probe station for wafer handling and uses a probe card for interface. Thus, this system can offer the DC and AC test functionality like the Open, Short, measure the power supply current and DC bias pins, and available wafer test easily

FEATURES

  • 1 Head / System
  • 40MHz Test Speed
  • 224 Parallel Test
  • Per Pin TG
  • FM/RA Possible
  • TR Measure Function Possible
  • ZIF I/F to Probe Card
  • Test Interface : PCI
  • Probe Interface : GPIB Control
  • Available Die Damage Protection
  • Available Over/Under stress Detection
  • VDD Over Current Detection
  • Defect Die Isolation
  • LINUX based user Software

SYSTEM SPECIFICATION

  • Driver : 5152 Ch/System
  • Hi Vol. Driver : 896 Ch/System
  • Power Supply : 448 Ch /System
  • Timing Set : 32 set
  • User Clock : 16Clock
  • Dual Strobe
  • 24X, 24Y Address
  • Pattern Depth : 2048 Line
  • UBM : 16Kbit/Pin for RA
  • DBM : 64M Byte/DUT

BLUE ENGINEERING INC. ADDRESS : 24-3, Simin-daero 109beon-gil, Dongan-gu, Anyang-si, Gyeonggi-do, Korea[14041]
TEL:+82-31-455-0631 FAX:+82-31-455-0632
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