The TDBI system is Memory(DRAM, Flash) Test Burn-In System, minimizes the test time using Dual Catch Ram and Smart Fail Catch RAM Structure/Algorithm and remove Fail Block Process Limit. It has high-test capability so that it is applicable to SRAM, DDR, and RDRAM besides Flash Memory. Operation of the TDBI system is provided by a microcomputer controlled, high speed burn-in driver system using Linux based UFO graphical software.
| Speed | 33MHz | |
| PG | Type | ALPG |
| Cycle Rate | 30ns ~ 10.24uS | |
| Cycle Resolution | 5ns | |
| TG | User Clock | 16 |
| No. of Timing Set | 128 | |
| Add. & Data Generator | Add. Generator | 24X, 24Y, 4Z |
| Data Generator | 18 bits | |
| Channel Q’ty | No. of Clock | 8ch / BIB |
| No. of Address | 32ch x 2 / BIB | |
| No. of I/O | 72ch / BIB | |
| PS | Current Range | PS1,2 (50A-Force, Sense) PS3 (18A-Force, Sense) |
Max Temperature : 150’C
Max Exhaust Flow : 1200 CFM
Compressed Air Pressure : 60 ~ 90 PSIG
Compressed Air Flow Rate : 6 ~ 9 CFM
Compressed Air Connection : 3/8” NPT
BIB Size : 450 x 570mm
BIB ID Read : 4×8 Diode Matrix
Power Condition : 208VAC, 3Phase,60Hz, WYE
BLUE ENGINEERING INC. ADDRESS : 24-3, Simin-daero 109beon-gil, Dongan-gu, Anyang-si, Gyeonggi-do, Korea[14041]
TEL:+82-31-455-0631 FAX:+82-31-455-0632
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