As preexisting DC-only Testers only measure Static DC, they cannot initialize device while running Power Up Sequence or Pattern or measure current after entering certain mode. Thus, they have high possibility of Burn-Out or Over Kill in Burn-In.
AIO700 Functional DC Test System is a system developed to solve these problems and perform DC and Function Test during Sorter Index Time to screen DC and Function Fail Device in early states to minimize loss of processes.